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Advantest Corporation (NYSE:ATE) , a vendor of semiconductor test equipment, today introduced a new digital module designed to enable low-cost, flexible testing of systems-on-chip (SoCs) incorporating advanced serializer/deserializer (SerDes) communications interfaces. The new Advantest 6.5Gbps digital module (DM) for the T2000 open- architecture test platform is the industry's first affordable test solution that can accommodate SoCs employing a variety of SerDes standards (e.g., PCI Express, SATA, XAUI and FBDIMM*), as well as source-synchronous devices such as microprocessors.

By reducing the number of data paths and thus the number of pins required, SerDes devices deliver increased bandwidth and reduced printed-circuit board routing and footprint, making them ideal for cell phones and other communications devices. Previous automated test equipment (ATE) has been unable to provide true at-speed testing of these complex devices, being costly and ill-equipped to cope with their associated frequency, crosstalk, clocking, logic and other issues.

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